AEMC測(ce)試(shi)儀  AEMC INSTRUMENTS測(ce)試(shi)儀

AEMC微歐姆表的設計*特，阻(zu)性(xing)和感性(xing)材(cai)(cai)料(liao)進(jin)行測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)，運營(ying)(ying)商(shang)選(xuan)擇直接從(cong)面板。三種(zhong)測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)模式(shi)可(ke)自動(dong)采用基于此選(xuan)擇：AEMC電(dian)阻(zu)（即地面粘接，涂料(liao)，接觸電(dian)阻(zu)）材(cai)(cai)料(liao)測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)與瞬時(shi)測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)。只(zhi)需按(an)下(xia)測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)按(an)鈕(niu)-閱讀是采取(qu)進(jin)一(yi)(yi)步的測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)結(jie)果感性(xing)材(cai)(cai)料(liao)（即線圈，變(bian)壓器，電(dian)機繞組）進(jin)行連續測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)。測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)運營(ying)(ying)商(shang)在一(yi)(yi)個按(an)鈕(niu)啟(qi)動(dong)和停止(zhi)自動(dong)測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)模式(shi)是專為多(duo)個AEMC測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)點電(dian)阻(zu)和/或低(di)電(dian)感材(cai)(cai)料(liao)。在按(an)下(xia)一(yi)(yi)個按(an)鈕(niu)開始測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)。作為運營(ying)(ying)商(shang)將(jiang)探頭從(cong)一(yi)(yi)點到(dao)另(ling)一(yi)(yi)點，停止(zhi)試(shi)(shi)(shi)(shi)(shi)驗，結(jie)果顯示，一(yi)(yi)個新(xin)的測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)開始時(shi)再次測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)探針接觸-無需按(an)下(xia)測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)按(an)鈕(niu)！剩余電(dian)壓測(ce)(ce)量(liang)與測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)，以確保正確的結(jie)果。該AEMC測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)模式(shi)繼續進(jin)行，直到(dao)操(cao)作員(yuan)按(an)下(xia)按(an)鈕(niu)結(jie)束測(ce)(ce)試(shi)(shi)(shi)(shi)(shi)。